统计研究 ›› 2006, Vol. 23 ›› Issue (2): 20-23.
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董丽娅;陈津端;成邦文
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Abstract: Abstract:It is shown that R&D activity has high concentricity in distribution. This paper deals with the measure of the concentricity. Some measuring indicators and method have been presented, which are very usefull in calculating Lorenz curve, GINI index and other measuring indicators according to the logarithm mean square of distribution of S&T activity σ =√D In ζ. Finally, some examples are used to illustrate the applications and the validity of new method of the'paper. It is shown that science and technology indicators reflecting system scale obey the lognormal distribution so that the results of this paper have practical values
董丽娅, 陈津端, 成邦文. 科技活动分布集中性的测度[J]. 统计研究, 2006, 23(2): 20-23.
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https://tjyj.stats.gov.cn/CN/Y2006/V23/I2/20
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